Suppress the Disturbance during the Semiconductor Process by using Adaptive Disturbance Observer

碩士 === 國立交通大學 === 機械工程系所 === 102 === It is well known that the common RtR controllers like EWMA and double EWMA suffer the decrease in stability region for weights and the oscillatory or long transient performance when there is a model mismatch. Besides, the optimum weights of RtR control obtained f...

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Bibliographic Details
Main Authors: Lin, Li-Hsun, 林立勳
Other Authors: Lee, An-Chen
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/28514272137194010756