An Embedded System for Measurement of Voltage Flicker

• Main Authors: Po-Tsung Shen, 沈柏璁
• Other Authors: Wen-Ren Yang
• Format: Others
• Language: zh-TW
• Published: 2014
• Online Access: http://ndltd.ncl.edu.tw/handle/22891790321842711504

碩士 === 國立彰化師範大學 === 電機工程學系 === 102 === The voltage flicker of the power utility is caused by the rapid changes of welding machine or arc furnace and other nonlinear systems. Voltage flicker affects the behavior of the lighting, causing flashing lights. In the situation, the eyes and body of human may cause physical discomfort, for example resulting in fatigue, nausea, dizziness and other phenomena, and may even harm eyesight. So there are a lot of literatures provide different methods of voltage flicker measurement in recent years. The IEC-61000-4-15(International Electrotechnical Commission) standard is becoming more internationally adopted for evaluating the flicker severity. The purpose of this thesis is to design an embedded system for measurement of voltage flicker. This thesis refers to the IEC 61000-4-15 voltage flicker specification to design the system. Because the IEC specification provides that the functional blocks are analog type, this thesis has to make it into digital systems so that the proposed system can implement the system into an embedded system according to the IEC 610000-4-15 standard. This thesis utilize the theory and methods of digital signal processing, and utilizes the NIOS-II, QUARTUS II software to establish it in Altera DE0-Nano hardware development board (FPGA), and complete the design of voltage flicker measurement.