Yield Improvement and High-performance Design in 3-D Integrated Circuits
博士 === 國立清華大學 === 資訊工程學系 === 102 === With the advances of VLSI design technology, yield loss, manufacturing cost, and reliability are more and more important. To tackle these issues, the yield improvement, cost reduction, and reliability mechanisms methodologies are required. In this dissertation, X...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/28897957667112097626 |