Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer

碩士 === 國立聯合大學 === 光電工程學系碩士班 === 102 === In various of technology of interferomerty , two kinds of interferometer are the most accurate such as phase-shifting interferometry and heterodyne interferometry. The heterodyne interferometry gets the signal from the certain beating with fixed frequency and...

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Main Authors: Ming-Hui Ke, 柯明輝
Other Authors: Ruey-Shyan Chang
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/17103913927620510426
id ndltd-TW-102NUUM0124003
record_format oai_dc
spelling ndltd-TW-102NUUM01240032017-03-11T04:21:45Z http://ndltd.ncl.edu.tw/handle/17103913927620510426 Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer 改良式相移干涉儀對玻璃折射率之均勻度的精密量測 Ming-Hui Ke 柯明輝 碩士 國立聯合大學 光電工程學系碩士班 102 In various of technology of interferomerty , two kinds of interferometer are the most accurate such as phase-shifting interferometry and heterodyne interferometry. The heterodyne interferometry gets the signal from the certain beating with fixed frequency and removes extended-band noise. So, the heterodyne interferomtry possess superior ratio of signal to noise. In phase-shifting interferomtry, we have to obtain many frames of interferogram by phase-shifting scheme for retrieve phase signal. The algorithm for phase retrieve adopts the method of subtraction of interferograms. In process of interferogram-subtraction, the fixed noise in interferograms can be cancelled and gets superior phase signal. So, phase-shifting interferometry is superior tool for phase measurement until now. Nevertheless, two types for getting many interferograms by phase-shifting scheme:one is so called simultaneous phase-shifting, and another is called time-domain phase shifting. Simultaneous phase-shifting technology possesses merits of avoiding random noise but the whole system is complex and expensive. We adopt the traditional time-domain phase-shifting interferometry, but we use the modified Sagnac parallel interferometers. One interferometer is for measuring the object and the other is used for monitoring the random noise. We can obtain two sets of phase diagram simultaneously. In similar process of subtraction, we can get accurate phase signal with cancelled random-noise. We proof that our scheme of the parallel interferometer is good result similar to simultaneous phase-shifting interferometry but the whole optical system is more simple and low-cost. Ruey-Shyan Chang 張瑞賢 2014 學位論文 ; thesis 124 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立聯合大學 === 光電工程學系碩士班 === 102 === In various of technology of interferomerty , two kinds of interferometer are the most accurate such as phase-shifting interferometry and heterodyne interferometry. The heterodyne interferometry gets the signal from the certain beating with fixed frequency and removes extended-band noise. So, the heterodyne interferomtry possess superior ratio of signal to noise. In phase-shifting interferomtry, we have to obtain many frames of interferogram by phase-shifting scheme for retrieve phase signal. The algorithm for phase retrieve adopts the method of subtraction of interferograms. In process of interferogram-subtraction, the fixed noise in interferograms can be cancelled and gets superior phase signal. So, phase-shifting interferometry is superior tool for phase measurement until now. Nevertheless, two types for getting many interferograms by phase-shifting scheme:one is so called simultaneous phase-shifting, and another is called time-domain phase shifting. Simultaneous phase-shifting technology possesses merits of avoiding random noise but the whole system is complex and expensive. We adopt the traditional time-domain phase-shifting interferometry, but we use the modified Sagnac parallel interferometers. One interferometer is for measuring the object and the other is used for monitoring the random noise. We can obtain two sets of phase diagram simultaneously. In similar process of subtraction, we can get accurate phase signal with cancelled random-noise. We proof that our scheme of the parallel interferometer is good result similar to simultaneous phase-shifting interferometry but the whole optical system is more simple and low-cost.
author2 Ruey-Shyan Chang
author_facet Ruey-Shyan Chang
Ming-Hui Ke
柯明輝
author Ming-Hui Ke
柯明輝
spellingShingle Ming-Hui Ke
柯明輝
Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
author_sort Ming-Hui Ke
title Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
title_short Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
title_full Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
title_fullStr Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
title_full_unstemmed Glass Refractive Index Uniformity Measurement Using Modified Phase-Shift Interferometer
title_sort glass refractive index uniformity measurement using modified phase-shift interferometer
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/17103913927620510426
work_keys_str_mv AT minghuike glassrefractiveindexuniformitymeasurementusingmodifiedphaseshiftinterferometer
AT kēmínghuī glassrefractiveindexuniformitymeasurementusingmodifiedphaseshiftinterferometer
AT minghuike gǎiliángshìxiāngyígànshèyíduìbōlízhéshèlǜzhījūnyúndùdejīngmìliàngcè
AT kēmínghuī gǎiliángshìxiāngyígànshèyíduìbōlízhéshèlǜzhījūnyúndùdejīngmìliàngcè
_version_ 1718420480044564480