| Summary: | 碩士 === 元智大學 === 光電工程學系 === 102 === In recent years, due to the flourishing growing of solar industries, the research for the characterization of the solar cells is getting a lot of attention. The performance of the solar cells is mainly affected by several important parameters of their physical characteristics. In the past, most of the electrical property measurement of solar cells was DC. It uses a diode model to analyze all the parameters of circuit elements. However, in recent years, there is AC impedance spectroscopy applied to solar cells. The measurement of AC impedance spectroscopy can simply characterize the P-N junctions in solar cells. It uses an equivalent circuit to model the solar cells. With the analysis of Nyquist and Bode plots, we can get series resistance, parallel resistance, capacitance, and the minority carrier lifetime. Therefore, this study is divided into two parts. The first part uses three different kinds of silicon solar cells to conduct the measurement of DC - electrical property and AC impedance spectroscopy with bias voltages from −0.5 V to 0.5 V. The analysis of DC measurement uses a double-diode model. The analysis of AC
measurement uses an equivalent circuit. The second part of the study is the application of the measurements to CIGS annealing analysis. We find that both the equivalent circuit model and the double-diode model can provide the extraction of various parameters. AC impedance spectroscopy
cannot yield the efficiency of the solar cells; however, it can provide the insight of the cell’s quality by the minority carrier’s lifetime.
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