The Research on The 28-nm All-Digital Temperature Sensor Design and Integration in The Variation Monitoring and Management System

• Main Authors: Shang-Yi Li, 李尚頤
• Other Authors: Jinn-Shyan Wang
• Format: Others
• Language: zh-TW
• Published: 2015
• Online Access: http://ndltd.ncl.edu.tw/handle/24ar7c

碩士 === 國立中正大學 === 電機工程研究所 === 103 === The increase in device density and speed of modern high performance processors cause chips to heat up and not removed quickly during runtime, thus resulting in thermal problems. The thermal management techniques are essential to be incorporated into systems to protect from damage. On-chip all-digital temperature sensors (TSs) have features as low cost, low power and easy integration. We design the all-digital TSs in 28-nm and integrate them in the variation monitoring and management system, which monitors the variations. However, the issues of the nominal voltage being near the zero-temperature- coefficient (ZTC) point, and the influence of serious process variations, cause the severe sensing errors. We design a new delay cell with improved temperature sensitivity. And a new method, adaptive one-point calibration, has better accuracy (4.7℃) than that of the conventional one-point calibration (7.6℃) with the similar calibration cost.