Study on The Yield Improvement of Carrier Tape by AOI System

• Main Authors: Ruei-Fong Chen, 陳瑞峰
• Other Authors: Te-Jen Su
• Format: Others
• Language: zh-TW
• Published: 2015
• Online Access: http://ndltd.ncl.edu.tw/handle/uze4py

碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 103 === There is no doubt that high quality is the irreversible trend for the development of carrier tape in the days ahead. As far as high quality requirement is concerned, supplemental inspection will unquestionably become an important procedure, especially for the R&D of new materials. Up until now, automated optical inspection AOI has been extensively adopted in many areas, using machine vision instead of workers to inspect finished products in order to upgrade production efficiency, defect-free rate, and consistency. Therefore, this study incorporated with AOI into the manufacturing process of a passive component named carrier tape in an effort to identify how AOI improved defect-free rate, reduced costs, and upgraded product quality within a short period of time. Manual inspection procedure involves many workers. There are many problems associated with manual inspection, such as inconsistent quality, missed measurement or misinterpretation, slowness, and unable to catch up with production automation. In an effort to satisfy the enterprises’ requirements for high precision and mass production, this study intended to establish an automated inspection architecture to solve the problems stated above and thereby upgrade the products’ competitive edge in the market.