| Summary: | 碩士 === 國立中興大學 === 材料科學與工程學系所 === 103 === Generally the outdoor photovoltaic (PV) module is usually exposed in the environment of high temperature, humidity, and system bias for a long time. The long-term climatic conditions and Potential Induced Degradation (PID) effect is not only to damage the external parts of silicon thin film PV module, but also to impact the internal parts such as transparent conductive oxide (TCO) thin film and resulted TCO corrosion and delamination. It will cause thin film PV module degrade efficiency and reduce its service life. In order to evaluate the endurance properties of module and TCO thin film for such system voltage with outdoor environment, Potential Induced Degradation (PID) test is the typical method. However PID test is based on the module as a test sample, modules manufacturing coupled with test time, whole evaluation process of new TCO material need to spend nearly three months. In this study, a new accelerated life testing method and setups are presented for simulation of the PID in the lab, and the influence of TCO properties on PID is demonstrated in order to reveal the TCO being the precondition for the module PID. The new testing can verify the PID endurance of TCO thin film directly thus significantly reduce the test time and cost, and also improve the evaluation efficiency and accuracy. The new TCO accelerated life testing method requires only 16 hours, it can rapid aging TCO film sample and obtained the durability data and information equivalent to 1027 hours conventional PID test.
Furthermore, the mechanisms for the conductivity failure of TCO thin film, and the influence factors of testing result are discussed in this study.
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