The Design of Testbed and Test Cases for LTE Security

碩士 === 國立交通大學 === 電控工程研究所 === 103

Bibliographic Details
Main Authors: Xu, Yui-wei, 許育瑋
Other Authors: Huang, Yu-Lun
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/vhmndn
id ndltd-TW-103NCTU5449062
record_format oai_dc
spelling ndltd-TW-103NCTU54490622019-05-15T22:33:38Z http://ndltd.ncl.edu.tw/handle/vhmndn The Design of Testbed and Test Cases for LTE Security LTE 安全測試平台與案例設計 Xu, Yui-wei 許育瑋 碩士 國立交通大學 電控工程研究所 103 Huang, Yu-Lun 黃育綸 2015 學位論文 ; thesis 106 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電控工程研究所 === 103
author2 Huang, Yu-Lun
author_facet Huang, Yu-Lun
Xu, Yui-wei
許育瑋
author Xu, Yui-wei
許育瑋
spellingShingle Xu, Yui-wei
許育瑋
The Design of Testbed and Test Cases for LTE Security
author_sort Xu, Yui-wei
title The Design of Testbed and Test Cases for LTE Security
title_short The Design of Testbed and Test Cases for LTE Security
title_full The Design of Testbed and Test Cases for LTE Security
title_fullStr The Design of Testbed and Test Cases for LTE Security
title_full_unstemmed The Design of Testbed and Test Cases for LTE Security
title_sort design of testbed and test cases for lte security
publishDate 2015
url http://ndltd.ncl.edu.tw/handle/vhmndn
work_keys_str_mv AT xuyuiwei thedesignoftestbedandtestcasesforltesecurity
AT xǔyùwěi thedesignoftestbedandtestcasesforltesecurity
AT xuyuiwei lteānquáncèshìpíngtáiyǔànlìshèjì
AT xǔyùwěi lteānquáncèshìpíngtáiyǔànlìshèjì
AT xuyuiwei designoftestbedandtestcasesforltesecurity
AT xǔyùwěi designoftestbedandtestcasesforltesecurity
_version_ 1719131033694109696