Wang, M., 王銘漢, & Wu, M. (2014). Stress and Warpage Analyses on the 3D and 2.5D ICs with TSV Structure under Thermal and Moisture Effects.
Chicago Style (17th ed.) CitationWang, Ming-Han, 王銘漢, and Mei-Ling Wu. Stress and Warpage Analyses on the 3D and 2.5D ICs with TSV Structure Under Thermal and Moisture Effects. 2014.
MLA (8th ed.) CitationWang, Ming-Han, et al. Stress and Warpage Analyses on the 3D and 2.5D ICs with TSV Structure Under Thermal and Moisture Effects. 2014.
Warning: These citations may not always be 100% accurate.