Employing temperature accelerated test to predict the lifespan of the LED lamps

• Main Authors: Ya-Ping Chen, 陳雅萍
• Other Authors: Yun-Kung Chung
• Format: Others
• Language: zh-TW
• Online Access: http://ndltd.ncl.edu.tw/handle/03996623835190570500

碩士 === 元智大學 === 工業工程與管理學系 === 103 === The output of LED light will fade as lighting continues on and on. Improper temperature, power and moisture are the main causes of destruction for LED which are also the factors that determine the LED lifespan. The degradation of LED in life expectancy is determined by the amount of current to a certain decrease in threshold, this is also known as Lumen Maintenance. This research is the use of illuminating engineering society of North America (IESNA) to develop LM-80 LED light source out of test method for maintaining under constant temperature accelerated life testing, The analysis environmental test condition of LED components are: 55 ℃, 85 ℃, 105 ℃ for a period of 6,000 hours lighting test. Sample 20 bulbs for each temperature measured, measuring lumen maintenance and record samples at every 1000h, up to 6,000 hours. Light attenuation of the experimental data can be obtained that LED decay up to 70% (L70) of time required, LED lamps using IES TM-21 to accelerate 10,000h lifespan prediction. Experimental results showing that temperature accelerated aging tests calculate the estimated lamp lifespan of: (1) 55℃: L70 for 122,208 hour, (2) 85℃:L70 for 91,656h and (3) 105℃:L70 for 52,375h; In conclusion for TM-21 method to predict life expectancy of 10,000h lumen maintenance L70 is estimated error to be less than 5%.