A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter
碩士 === 元智大學 === 工業工程與管理學系 === 103 === Coating-Thickness is an important index of PCB soldering quality. The purpose of this paper is to find the best parameter of X-Ray so as to enhance the accuracy of coating-thickness measurement. This DOE is base on three key factors: collimator, measure-time and...
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ndltd-TW-103YZU050311012017-02-26T04:27:57Z http://ndltd.ncl.edu.tw/handle/31625685274025225926 A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter 以X-Ray機臺量測鍍層厚度參數最佳化之探討 Yun-Ling Lin 林藝鈴 碩士 元智大學 工業工程與管理學系 103 Coating-Thickness is an important index of PCB soldering quality. The purpose of this paper is to find the best parameter of X-Ray so as to enhance the accuracy of coating-thickness measurement. This DOE is base on three key factors: collimator, measure-time and pad size for Full Factorial Design. Using response variables to identify the difference between the measuring value and the reference value and the variance of repeatability(CV%) . Base on the analysis result of DOE, we have achieved best parameter of X-Ray. Base on the capability of the machine, will need to choose big collimator with measure-time of 80 seconds. Keywords : X-Ray、DOE、coating-thickness、Optimization、Measure Parameter Yun-Shiow Chen 陳雲岫 學位論文 ; thesis 53 zh-TW |
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碩士 === 元智大學 === 工業工程與管理學系 === 103 === Coating-Thickness is an important index of PCB soldering quality.
The purpose of this paper is to find the best parameter of X-Ray so as to enhance the accuracy of coating-thickness measurement.
This DOE is base on three key factors: collimator, measure-time and pad
size for Full Factorial Design. Using response variables to identify the difference between the measuring value and the reference value and the variance of repeatability(CV%) . Base on the analysis result of DOE, we have achieved best parameter of X-Ray. Base on the capability of the machine, will need to choose big collimator with measure-time of 80 seconds.
Keywords : X-Ray、DOE、coating-thickness、Optimization、Measure Parameter
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Yun-Shiow Chen |
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Yun-Shiow Chen Yun-Ling Lin 林藝鈴 |
author |
Yun-Ling Lin 林藝鈴 |
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Yun-Ling Lin 林藝鈴 A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
author_sort |
Yun-Ling Lin |
title |
A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
title_short |
A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
title_full |
A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
title_fullStr |
A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
title_full_unstemmed |
A Study on Using X-Ray Machine to Measure the Optimization Coating-Thickness Parameter |
title_sort |
study on using x-ray machine to measure the optimization coating-thickness parameter |
url |
http://ndltd.ncl.edu.tw/handle/31625685274025225926 |
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