The effect of strain relaxation induced stacking fault in (001) epitaxial FePd thin film on magnetization reversal
博士 === 國立清華大學 === 材料科學工程學系 === 104 === In this study, [Fe 14 Å /Pd19 Å]5 and [Fe 3 Å /Pd 4 Å]5 thin films were grown at elevated temperatures by an ultra-high vacuum electron beam deposition on MgO (100) substrates. When [Fe14 Å /Pd19 Å]5 was prepared at 400 oC, the upper part of thin film remains l...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2016
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Online Access: | http://ndltd.ncl.edu.tw/handle/47855958965869764866 |