Failure-Pattern-Based Memory Test Data Analysis for Failure Classification and Yield Improvement
博士 === 國立清華大學 === 電機工程學系 === 104 === Memories have been considered as one of the major drivers of CMOS technology, due to their high density, high capacity, critical timing, sensitivity, etc. Memory diagnosis is therefore important for technology and product development. In memory diagnosis, memory...
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| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/97040471847690775321 |