| Summary: | 碩士 === 國立臺北科技大學 === 工業工程與管理系EMBA班 === 104 === The test of the semiconductor is a mature industry, the equipment and machine for production is becoming stable, and the investment of equipment is also reduced. The rise of the red supply chain also reduces the profit from testing. So the expenditure on purchase of equipment is a matter to think over. It is thus form the emerging market of second-hand equipment.
The wafer prober is equipment carries wafers, and the main function is to categorize the wafer and send the test result to prober through the tester and probe card. As for now, probers are mainly Japanese brand, and among them the brand A is the most popular one in the market. The purchase is usually based on brand image with engineer’s experience. However, for there are many parameters of prober to consider, different engineers often have a different outcome of the procurement.
This study proposed a system used on prober equipment to resolve differences in the procurement issue. First, literature review with the industry experience was adopted to define the problem, then use the Delphi method (Delphi Method) to decide important parameters of purchasing decisions. The study determined the level of each parameter from the experience of engineers, then used AHP (Analytic Hierarchy Process) questionnaire method to collect data. It is expected that the result of the proposed system, optimal parameters level combination, will obtain a better performance.
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