SNM-Aware Subthreshold SRAM Cell and Array Designs
碩士 === 國立中正大學 === 電機工程研究所 === 105 === In recent years, with the development of portable electronic products, all kinds of hardware are designed for low-power consumption. SRAM, it’s very important part in SOC. This paper will introduce from the point of view of cell structure to realize the importan...
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ndltd-TW-105CCU004420582019-05-15T23:31:52Z http://ndltd.ncl.edu.tw/handle/dy79w7 SNM-Aware Subthreshold SRAM Cell and Array Designs 靜態雜訊容忍度基準之臨界電壓靜態隨機存取記憶體細胞元與陣列設計 WENG, WEI-JIA 翁偉嘉 碩士 國立中正大學 電機工程研究所 105 In recent years, with the development of portable electronic products, all kinds of hardware are designed for low-power consumption. SRAM, it’s very important part in SOC. This paper will introduce from the point of view of cell structure to realize the importance of SRAM in sub-threshold voltage region. And then, for low-power consumption and small-area designs in 40nm process, we will discuss all the design issues about sub-threshold voltage design. First, we will list the problem of conventional 6T SRAM about sub-threshold voltage design in 40nm process, Then select the two works to meet all the sub-threshold voltage design issues. To determine the best cell size by improvement of cell design flow and the more advantageous one will be implement the complete memory circuit and improve in 40nm process. To compare advantages of each work , the another work will reference the data of the paper. Finally, we will analyze the data fully and make a conclusion. WANG, JINN-SHYAN 王進賢 2017 學位論文 ; thesis 72 zh-TW |
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碩士 === 國立中正大學 === 電機工程研究所 === 105 === In recent years, with the development of portable electronic products, all kinds of hardware are designed for low-power consumption. SRAM, it’s very important part in SOC.
This paper will introduce from the point of view of cell structure to realize the importance of SRAM in sub-threshold voltage region. And then, for low-power consumption and small-area designs in 40nm process, we will discuss all the design issues about sub-threshold voltage design.
First, we will list the problem of conventional 6T SRAM about sub-threshold voltage design in 40nm process, Then select the two works to meet all the sub-threshold voltage design issues. To determine the best cell size by improvement of cell design flow and the more advantageous one will be implement the complete memory circuit and improve in 40nm process. To compare advantages of each work , the another work will reference the data of the paper. Finally, we will analyze the data fully and make a conclusion.
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author2 |
WANG, JINN-SHYAN |
author_facet |
WANG, JINN-SHYAN WENG, WEI-JIA 翁偉嘉 |
author |
WENG, WEI-JIA 翁偉嘉 |
spellingShingle |
WENG, WEI-JIA 翁偉嘉 SNM-Aware Subthreshold SRAM Cell and Array Designs |
author_sort |
WENG, WEI-JIA |
title |
SNM-Aware Subthreshold SRAM Cell and Array Designs |
title_short |
SNM-Aware Subthreshold SRAM Cell and Array Designs |
title_full |
SNM-Aware Subthreshold SRAM Cell and Array Designs |
title_fullStr |
SNM-Aware Subthreshold SRAM Cell and Array Designs |
title_full_unstemmed |
SNM-Aware Subthreshold SRAM Cell and Array Designs |
title_sort |
snm-aware subthreshold sram cell and array designs |
publishDate |
2017 |
url |
http://ndltd.ncl.edu.tw/handle/dy79w7 |
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