| Summary: | 碩士 === 逢甲大學 === 電機工程學系 === 105 === This thesis presents a cylindrical vector interferometry for measuring the characteristic parameters of the optical wave plates, based on the Mach-Zehnder interferometer. In the apparatus, the linearly polarized beam passes through a cylindrical vector generating element to generate cylindrical vector polarization beams. Then the beams pass through the Mach-Zehnder interferometer, where one of arm put a tested wave plate, to form interference fringes. The interferometric patterns can be captured by a complementary metal oxide–semiconductor camera. Analyzing the intensities of the interferometric patterns, the phase retardation and fast axis angle of wave plates can be simultaneously obtained with a specially derived equation. To validate the proposed method, the half-wave plate and quarter-wave plate were measured experimentally. The measured results are consistent with the theoretical data. Compared to other methods, in which they need to continuously rotate the analyzer or wave plate, this method just requires only two interferometric patterns to measure the characteristic parameters of the optical wave plates. Therefore, it has the advantages of rapidly measurement and easily operation.
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