The Masked Effect of Defect Detection from Wafer Bin Maps

The Masked Effect of Defect Detection from Wafer Bin Maps

碩士 === 國立成功大學 === 統計學系 === 105

Bibliographic Details
Main Authors: Tzu-YiTseng, 曾姿翊
Other Authors: Shuen-Lin Jeng
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/2kp8t7
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spelling ndltd-TW-105NCKU53370122019-05-15T23:47:01Z http://ndltd.ncl.edu.tw/handle/2kp8t7 The Masked Effect of Defect Detection from Wafer Bin Maps 晶圓片缺陷檢測的遮蔽效應之探討 Tzu-YiTseng 曾姿翊 碩士 國立成功大學 統計學系 105 Shuen-Lin Jeng 鄭順林 2017 學位論文 ; thesis 70 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 國立成功大學 === 統計學系 === 105
author2 Shuen-Lin Jeng
author_facet Shuen-Lin Jeng
Tzu-YiTseng
曾姿翊
author Tzu-YiTseng
曾姿翊
spellingShingle Tzu-YiTseng
曾姿翊
The Masked Effect of Defect Detection from Wafer Bin Maps
author_sort Tzu-YiTseng
title The Masked Effect of Defect Detection from Wafer Bin Maps
title_short The Masked Effect of Defect Detection from Wafer Bin Maps
title_full The Masked Effect of Defect Detection from Wafer Bin Maps
title_fullStr The Masked Effect of Defect Detection from Wafer Bin Maps
title_full_unstemmed The Masked Effect of Defect Detection from Wafer Bin Maps
title_sort masked effect of defect detection from wafer bin maps
publishDate 2017
url http://ndltd.ncl.edu.tw/handle/2kp8t7
work_keys_str_mv AT tzuyitseng themaskedeffectofdefectdetectionfromwaferbinmaps
AT céngzīyì themaskedeffectofdefectdetectionfromwaferbinmaps
AT tzuyitseng jīngyuánpiànquēxiànjiǎncèdezhēbìxiàoyīngzhītàntǎo
AT céngzīyì jīngyuánpiànquēxiànjiǎncèdezhēbìxiàoyīngzhītàntǎo
AT tzuyitseng maskedeffectofdefectdetectionfromwaferbinmaps
AT céngzīyì maskedeffectofdefectdetectionfromwaferbinmaps
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