Research of thin film stress measurement
碩士 === 國立中央大學 === 光電科學與工程學系 === 105 === In this thesis, we propose a method measuring thin film stress on 8-inch substrate. The cantilever method is used as the basis for the improvement of the measuring system. We use dual electron beam gun evaporation with ion-beam assisted deposition to evaporate...
Main Authors: | , |
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Format: | Others |
Language: | zh-TW |
Published: |
2017
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Online Access: | http://ndltd.ncl.edu.tw/handle/74457187561778909409 |