Influence of Growth-induced Surface Roughness on the Optoelectronic Characteristic and Reliability of InGaN Light Emitting Diode Chips
碩士 === 國立彰化師範大學 === 光電科技研究所 === 105 === In this thesis, the influence of growth-induced surface roughness on the optoelectronic characteristic and reliability of InGaN light emitting diode chips are investigated. First of all, the basic characteristics of light emitting diodes (LEDs) including the o...
Main Authors: | Yang, Wen-Chu, 楊文筑 |
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Other Authors: | Huang, Man-Fang |
Format: | Others |
Language: | zh-TW |
Published: |
2017
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Online Access: | http://ndltd.ncl.edu.tw/handle/9tcd82 |
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