Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope

博士 === 國立清華大學 === 工程與系統科學系 === 105 === abstract hide

Bibliographic Details
Main Authors:	Chang, Wei-Yu, 張維祐
Other Authors:	Chen, Fu-Rong
Format:	Others
Language:	zh-TW
Published:	2017
Online Access:	http://ndltd.ncl.edu.tw/handle/6wtz4n

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record_format	oai_dc
spelling	ndltd-TW-105NTHU55930192019-05-15T23:53:46Z http://ndltd.ncl.edu.tw/handle/6wtz4n Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope 發展桌上型像差修正掃描穿透式電鏡 Chang, Wei-Yu 張維祐博士國立清華大學工程與系統科學系 105 abstract hide Chen, Fu-Rong 陳福榮 2017 學位論文 ; thesis 117 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	博士 === 國立清華大學 === 工程與系統科學系 === 105 === abstract hide
author2	Chen, Fu-Rong
author_facet	Chen, Fu-Rong Chang, Wei-Yu 張維祐
author	Chang, Wei-Yu 張維祐
spellingShingle	Chang, Wei-Yu 張維祐 Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
author_sort	Chang, Wei-Yu
title	Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
title_short	Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
title_full	Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
title_fullStr	Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
title_full_unstemmed	Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope
title_sort	development of the desktop aberration-corrected scanning transmission electron microscope
publishDate	2017
url	http://ndltd.ncl.edu.tw/handle/6wtz4n
work_keys_str_mv	AT changweiyu developmentofthedesktopaberrationcorrectedscanningtransmissionelectronmicroscope AT zhāngwéiyòu developmentofthedesktopaberrationcorrectedscanningtransmissionelectronmicroscope AT changweiyu fāzhǎnzhuōshàngxíngxiàngchàxiūzhèngsǎomiáochuāntòushìdiànjìng AT zhāngwéiyòu fāzhǎnzhuōshàngxíngxiàngchàxiūzhèngsǎomiáochuāntòushìdiànjìng
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Development of the Desktop Aberration-Corrected Scanning Transmission Electron Microscope

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