Scrubbing-aware Sanitization for 3D NAND Flash

碩士 === 國立臺灣大學 === 資訊工程學研究所 === 105 === Because of the increasing concern of data security, the ability of traditional erase and deletion commands can no longer support such a security requirement of today’s storage systems. As a result, the ideas of sanitization and scrubbing operations are proposed...

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Bibliographic Details
Main Authors: Wei-Chen Wang, 王韋程
Other Authors: Tei-Wei Kuo
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/95086435849386708689
Description
Summary:碩士 === 國立臺灣大學 === 資訊工程學研究所 === 105 === Because of the increasing concern of data security, the ability of traditional erase and deletion commands can no longer support such a security requirement of today’s storage systems. As a result, the ideas of sanitization and scrubbing operations are proposed to meet the needs of clearly and completely removing the sensitive data from the storage devices physically. However, the sanitization process can result in the significant overhead of live-page-copying, and the scrubbing can result in the disturbance issues. In this work, we aim at exploring a way to take advantage of benefits of both sanitization and scrubbing operations to propose an efficient sanitization design for 3D NAND flash memory. Different from the past work which adopted encryption-based and erase-based schemes to achieve the goal of data sanitization, this paper exploiting the considerations of scrubbing disturbances and characteristics of 3D flash memory (e.g., programming latency and page layout) to improve the performance of sanitization. In addition, a grouping-based write strategy is proposed to not only reduce the live-page-copying overheads but also exploit the disturbance property to improve sanitization efficiency. The capability of the proposed design is evaluated by a series of experiments, for which we have very encouraging results.