CMOS image sensor test method
碩士 === 中華大學 === 電機工程學系 === 107 === This paper discusses the test method of CMOS Image Sensor (CIS), which uses the independent precision measurement function of digital signal tester as the basis of CIS test, and then according to the signal format of D-PHY protocol of Mobile Industry Processor Inte...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/urx865 |
| Summary: | 碩士 === 中華大學 === 電機工程學系 === 107 === This paper discusses the test method of CMOS Image Sensor (CIS), which uses the independent precision measurement function of digital signal tester as the basis of CIS test, and then according to the signal format of D-PHY protocol of Mobile Industry Processor Interface (MIPI) Alliance. The image processing accessories for decoding and sorting are designed, and the digital signal testing machine is combined with the image processing accessories to form a CIS testing machine, and a testing process flow is established, and finally the electrical and image testing of the CIS is performed.
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