A Measurement System for High-Voltage Diodes

• Main Authors: Chi-Lun Huang, 黃啟倫
• Other Authors: Han-Wen Liu
• Format: Others
• Language: zh-TW
• Published: 2018
• Online Access: http://ndltd.ncl.edu.tw/handle/dc5h7z

碩士 === 國立中興大學 === 電機工程學系所 === 106 === This thesis proposes a novel system to measure the forward voltage (VF) and reverse breakdown voltage (VZ) of a diode, based on the MIL-STD-750-4 (US Department of Defense Test Method Standard) and the measuring system utilizes the 4-wired mode measurements. The measuring system is equipped with ST Microelectronics ARM Cortex-M4 MCU, Analog Device 16 bit DAC/16 bit ADC and implements a method to control the amount and duration of output current by a programmable MCU. Measurement accuracy is improved with digital filtering and increased signal-to-noise ratio by multi-sense resisters. As compared to the measuring results of Keithley’s equipment, the system, after calibration and optimization, can achieve accuracy with less than 0.5% error.