A Measurement System for High-Voltage Diodes
碩士 === 國立中興大學 === 電機工程學系所 === 106 === This thesis proposes a novel system to measure the forward voltage (VF) and reverse breakdown voltage (VZ) of a diode, based on the MIL-STD-750-4 (US Department of Defense Test Method Standard) and the measuring system utilizes the 4-wired mode measurements. The...
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ndltd-TW-106NCHU54410292019-05-16T01:24:30Z http://ndltd.ncl.edu.tw/handle/dc5h7z A Measurement System for High-Voltage Diodes 高壓二極體電性量測系統 Chi-Lun Huang 黃啟倫 碩士 國立中興大學 電機工程學系所 106 This thesis proposes a novel system to measure the forward voltage (VF) and reverse breakdown voltage (VZ) of a diode, based on the MIL-STD-750-4 (US Department of Defense Test Method Standard) and the measuring system utilizes the 4-wired mode measurements. The measuring system is equipped with ST Microelectronics ARM Cortex-M4 MCU, Analog Device 16 bit DAC/16 bit ADC and implements a method to control the amount and duration of output current by a programmable MCU. Measurement accuracy is improved with digital filtering and increased signal-to-noise ratio by multi-sense resisters. As compared to the measuring results of Keithley’s equipment, the system, after calibration and optimization, can achieve accuracy with less than 0.5% error. Han-Wen Liu Wei-Liang Lin 劉漢文 林維亮 2018 學位論文 ; thesis 68 zh-TW |
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碩士 === 國立中興大學 === 電機工程學系所 === 106 === This thesis proposes a novel system to measure the forward voltage (VF) and reverse breakdown voltage (VZ) of a diode, based on the MIL-STD-750-4 (US Department of Defense Test Method Standard) and the measuring system utilizes the 4-wired mode measurements. The measuring system is equipped with ST Microelectronics ARM Cortex-M4 MCU, Analog Device 16 bit DAC/16 bit ADC and implements a method to control the amount and duration of output current by a programmable MCU. Measurement accuracy is improved with digital filtering and increased signal-to-noise ratio by multi-sense resisters. As compared to the measuring results of Keithley’s equipment, the system, after calibration and optimization, can achieve accuracy with less than 0.5% error.
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author2 |
Han-Wen Liu |
author_facet |
Han-Wen Liu Chi-Lun Huang 黃啟倫 |
author |
Chi-Lun Huang 黃啟倫 |
spellingShingle |
Chi-Lun Huang 黃啟倫 A Measurement System for High-Voltage Diodes |
author_sort |
Chi-Lun Huang |
title |
A Measurement System for High-Voltage Diodes |
title_short |
A Measurement System for High-Voltage Diodes |
title_full |
A Measurement System for High-Voltage Diodes |
title_fullStr |
A Measurement System for High-Voltage Diodes |
title_full_unstemmed |
A Measurement System for High-Voltage Diodes |
title_sort |
measurement system for high-voltage diodes |
publishDate |
2018 |
url |
http://ndltd.ncl.edu.tw/handle/dc5h7z |
work_keys_str_mv |
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