A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism

碩士 === 國立交通大學 === 電子研究所 === 106

Bibliographic Details
Main Authors: Jiang, Meng-Ru, 江孟儒
Other Authors: Chung, Steve S.
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/7s8738
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spelling ndltd-TW-106NCTU54280232019-05-16T00:08:12Z http://ndltd.ncl.edu.tw/handle/7s8738 A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism 14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響 Jiang, Meng-Ru 江孟儒 碩士 國立交通大學 電子研究所 106 Chung, Steve S. 莊紹勳 2017 學位論文 ; thesis 52 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 106
author2 Chung, Steve S.
author_facet Chung, Steve S.
Jiang, Meng-Ru
江孟儒
author Jiang, Meng-Ru
江孟儒
spellingShingle Jiang, Meng-Ru
江孟儒
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
author_sort Jiang, Meng-Ru
title A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
title_short A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
title_full A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
title_fullStr A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
title_full_unstemmed A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
title_sort new temperature measurement technique of the self-heating effect in 14nm finfet and its impact on the transport mechanism
publishDate 2017
url http://ndltd.ncl.edu.tw/handle/7s8738
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