A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
碩士 === 國立交通大學 === 電子研究所 === 106
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ndltd-TW-106NCTU54280232019-05-16T00:08:12Z http://ndltd.ncl.edu.tw/handle/7s8738 A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism 14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響 Jiang, Meng-Ru 江孟儒 碩士 國立交通大學 電子研究所 106 Chung, Steve S. 莊紹勳 2017 學位論文 ; thesis 52 en_US |
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碩士 === 國立交通大學 === 電子研究所 === 106 |
author2 |
Chung, Steve S. |
author_facet |
Chung, Steve S. Jiang, Meng-Ru 江孟儒 |
author |
Jiang, Meng-Ru 江孟儒 |
spellingShingle |
Jiang, Meng-Ru 江孟儒 A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
author_sort |
Jiang, Meng-Ru |
title |
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
title_short |
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
title_full |
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
title_fullStr |
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
title_full_unstemmed |
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism |
title_sort |
new temperature measurement technique of the self-heating effect in 14nm finfet and its impact on the transport mechanism |
publishDate |
2017 |
url |
http://ndltd.ncl.edu.tw/handle/7s8738 |
work_keys_str_mv |
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