Numerical Verification for Prediction of Gallium Nitride Thin Film Growth

博士 === 國立中央大學 === 機械工程學系 === 106 === A numerical procedure was performed to simplify the complicated mechanism of an epitaxial thin-film growth process. In this study, three numerical mechanism models are presented for verifying the growth rate of the gallium nitride (GaN) mechanism. The mechanism m...

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Bibliographic Details
Main Authors: Chih-Kai, Hu, 胡智愷
Other Authors: 利定東
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/sn376n