Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment

碩士 === 國立清華大學 === 電子工程研究所 === 106 === abstract hide

Bibliographic Details
Main Authors:	Chang, Yu-Hsuan, 張祐瑄
Other Authors:	Huang, Chih-Fang
Format:	Others
Language:	zh-TW
Published:	2018
Online Access:	http://ndltd.ncl.edu.tw/handle/347ywr

id	ndltd-TW-106NTHU5428041
record_format	oai_dc
spelling	ndltd-TW-106NTHU54280412019-05-30T03:50:26Z http://ndltd.ncl.edu.tw/handle/347ywr Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment 探討不同表面處理對水平式閘極氮化鎵金氧半場效電晶體介面缺陷之影響 Chang, Yu-Hsuan 張祐瑄碩士國立清華大學電子工程研究所 106 abstract hide Huang, Chih-Fang 黃智方 2018 學位論文 ; thesis 77 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	碩士 === 國立清華大學 === 電子工程研究所 === 106 === abstract hide
author2	Huang, Chih-Fang
author_facet	Huang, Chih-Fang Chang, Yu-Hsuan 張祐瑄
author	Chang, Yu-Hsuan 張祐瑄
spellingShingle	Chang, Yu-Hsuan 張祐瑄 Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
author_sort	Chang, Yu-Hsuan
title	Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
title_short	Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
title_full	Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
title_fullStr	Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
title_full_unstemmed	Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment
title_sort	investigation on interface traps of planar gan mosfets with different surface treatment
publishDate	2018
url	http://ndltd.ncl.edu.tw/handle/347ywr
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Investigation on Interface Traps of Planar GaN MOSFETs with Different Surface Treatment

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