Life Distribution and Reliability Assessment of IGBT Modules under Power Cycling
碩士 === 國立臺灣大學 === 機械工程學研究所 === 106 === Along with the development of electric vehicles, the reliability issue of insulated gate bipolar transistor (IGBT) modules has gained attention in recent years. In this research, the lifetime of an IGBT module is estimated first without considering dimensional...
Main Authors: | Yuan-You Chen, 陳沅佑 |
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Other Authors: | Wen-Fang Wu |
Format: | Others |
Language: | zh-TW |
Published: |
2018
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Online Access: | http://ndltd.ncl.edu.tw/handle/zep372 |
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