Study on Parallelizing Test Pattern Generation On Shared-Memory System From Deterministic and Non-Deterministic Perspectives
博士 === 國立交通大學 === 電機工程學系 === 107 === Shared-memory systems enable parallel computing for Automatic Test Pattern Generation (ATPG). Although existing parallel ATPG can reach near-linear speedup, the problem of test inflation becomes a critical issue to its practicality. This thesis consisting of a de...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2019
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/5h6g77 |
