Study on Parallelizing Test Pattern Generation On Shared-Memory System From Deterministic and Non-Deterministic Perspectives
博士 === 國立交通大學 === 電機工程學系 === 107 === Shared-memory systems enable parallel computing for Automatic Test Pattern Generation (ATPG). Although existing parallel ATPG can reach near-linear speedup, the problem of test inflation becomes a critical issue to its practicality. This thesis consisting of a de...
Main Authors: | Lin, Yu-Ze, 林昱澤 |
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Other Authors: | Wen, Hung-Ping |
Format: | Others |
Language: | en_US |
Published: |
2019
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Online Access: | http://ndltd.ncl.edu.tw/handle/5h6g77 |
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