Construction of Confidence Intervals for Process Yield Using Bootstrap Simulation with R

• Main Authors: CHEN,DE-JHENG, 陳德正
• Other Authors: Shu, Ming-Hung
• Format: Others
• Language: zh-TW
• Published: 2019
• Online Access: http://ndltd.ncl.edu.tw/handle/9whb3b

碩士 === 國立高雄科技大學 === 工業工程與管理系 === 107 === ABSTRACT In an enterprise environment where fierce competition and rapidly changing, in order to win in qualifying orders, manufacturers must understand the needs of consumers. In the environment of rapid improvement in the quality of life, consumers’ demand for products gradually shifts from cost dependence to Quality is valued. Therefore, in recent years, the concept of multi-quality process capability has been proposed to improve the quality of products. Process Capability Analysis is one of the important technologies in SPC. To assess the pros and cons of the actual performance of the process by Process Capability Index, The commonly used Process Capability Index include Cp 、Cpk 、Cpm. Process yield and Process Capability Index are inseparable. In addition to providing quality control personnel to judge the quality of the process or product, process yield is also a good basis for the company to display products. There is a one-to-one direct relationship between the Cp Index and the S_PK Index and the process yield. The Cp Index must be used in the process average equal to the specification centerline. However, the Spk Index is not standardized, so it is more widely used. The commonly used Cpk Index and process yield in the industry are only inequality. The objective of this study is to use a bootstrap simulation to construct the bootstrap con_dence interval for the process yield based on Spk .