Resistance Switching Mechanism, Reliability and Logic Application in 1T1R Structure Resistive Random Access Memory

博士 === 國立中山大學 === 物理學系研究所 === 107 === With the evolution of the electron technologies, humans have evolved from mechanized manufacturing, automation control to cyber physical systems in industrial history. The system uses a lot of processing methods such as the Internet of Things, big data, and clou...

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Bibliographic Details
Main Authors: Yu-Ting Su, 蘇郁庭
Other Authors: Ting-Chang Chang
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/z3u2t7