Query-Adapted Metric Learning and Discriminative Feature Selection for Few-Shot Recognition
碩士 === 國立清華大學 === 資訊工程學系所 === 107 === Few-shot recognition aims to recognize novel classes with only a few training samples and alleviates the cost of data collection and labeling. In this thesis, we propose a deep metric and integrate existing metric learning approaches to compare the dissimilarity...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2018
|
Online Access: | http://ndltd.ncl.edu.tw/handle/pext4u |