Query-Adapted Metric Learning and Discriminative Feature Selection for Few-Shot Recognition

碩士 === 國立清華大學 === 資訊工程學系所 === 107 === Few-shot recognition aims to recognize novel classes with only a few training samples and alleviates the cost of data collection and labeling. In this thesis, we propose a deep metric and integrate existing metric learning approaches to compare the dissimilarity...

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Bibliographic Details
Main Authors: Liou, You-Sin, 劉祐欣
Other Authors: Hsu, Chiou-Ting
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/pext4u