Nano-scale displacement measuring Fizeau interferometer using electro-optical phase modulators

碩士 === 國立臺灣大學 === 機械工程學研究所 === 107 === In the progress of technology, the demand of high-precision industry for high-precision inspection equipment is getting higher. The demands in industry are mainly from semiconductor manufacturing companies. The equipment with easy machine installation and small...

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Bibliographic Details
Main Authors: Chin-Yu Hsieh, 謝晉祐
Other Authors: Liang-Chia Chen
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/2a6x5c