Nano-scale displacement measuring Fizeau interferometer using electro-optical phase modulators
碩士 === 國立臺灣大學 === 機械工程學研究所 === 107 === In the progress of technology, the demand of high-precision industry for high-precision inspection equipment is getting higher. The demands in industry are mainly from semiconductor manufacturing companies. The equipment with easy machine installation and small...
Main Authors: | Chin-Yu Hsieh, 謝晉祐 |
---|---|
Other Authors: | Liang-Chia Chen |
Format: | Others |
Language: | zh-TW |
Published: |
2019
|
Online Access: | http://ndltd.ncl.edu.tw/handle/2a6x5c |
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