A Testing Tool for IoT Gateway and Devices

• Main Authors: CHANG,WEI-CHE, 張偉哲
• Other Authors: LIU,CHIEN-HUNG
• Format: Others
• Language: zh-TW
• Published: 2018
• Online Access: http://ndltd.ncl.edu.tw/handle/wpmxb2

碩士 === 國立臺北科技大學 === 資訊工程系 === 107 === Internet of Things (IoT) testing usually involves multiple communication protocols and different hardware devices. Together with complex user scenarios of IoT applications and frequently updated firmware, it can be time-consuming and error-prone to build various test environments and conduct IoT testing manually. To alleviate the problem, this thesis presents an automated IoT Testing Tool, called IoT3. IoT3 can automatically build test environments and execute tests for IoT gateway and devices. Particularly, IoT3 supports keyword-driven testing method, which facilitates the development and maintenance of IoT test scripts. In addition, to increase the controllability, observability, and scalability as well as to reduce the cost of testing IoT gateway and devices, a mock device method is proposed. The mock device is composed of a wireless adapter and configurable mock services. Specifically, it can easily simulate the changes of test environment, such as temperature and humidity, and the packet loss rate of varied Bluetooth connection quality caused by multi-interference sources and different geographical location distances of devices. To evaluate the effectiveness of IoT3, an industrial case was studied. The experimental results indicate that the proposed mock device method indeed can simulate the behavior of the real devices and the changes of test environment. As compared with manual tests, IoT3 can save more test time and achieve higher test coverage. Further, IoT3 can also provide more information regarding the test results to facilitate problem diagnosis and debugging.