The Study of Non-Reducible High Temperature Stable Dielectric Ceramics

博士 === 國立臺北科技大學 === 材料科學與工程研究所 === 107 === This study investigated non-reducible temperature-stable dielectric ceramics that were non-reducible when sintered and had stable dielectric properties at high temperatures (≥150°C). On the basis of the specifications established by the EIA (Electronic Indu...

Full description

Bibliographic Details
Main Authors: Jian-Hua Li, 李建樺
Other Authors: 王錫福
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/hgzq5k
id ndltd-TW-107TIT05159004
record_format oai_dc
spelling ndltd-TW-107TIT051590042019-05-16T01:40:43Z http://ndltd.ncl.edu.tw/handle/hgzq5k The Study of Non-Reducible High Temperature Stable Dielectric Ceramics 抗還原高溫穩定介電陶瓷材料研究 Jian-Hua Li 李建樺 博士 國立臺北科技大學 材料科學與工程研究所 107 This study investigated non-reducible temperature-stable dielectric ceramics that were non-reducible when sintered and had stable dielectric properties at high temperatures (≥150°C). On the basis of the specifications established by the EIA (Electronic Industries Alliance, U.S.A.) for high dielectric constant capacitors (class II), the materials examined in this study were (1) an X8R dielectric ceramic (−55°C–150°C, ΔC25°C ≤ 15%) and (2) an X9R dielectric ceramic (−55°C–200°C, ΔC25°C ≤ 15%). These two dielectric ceramics that could be applied to different temperature ranges were investigated from different perspectives of material design. Their applicability for use on multilayer ceramic capacitors were tested. To examine the non-reducible X8R dielectric ceramic, BaTiO3+0.05 mol% MnCO3+1.37 mol% BaSiO3 was used as a host material to investigate the effects of varying amounts of additives (0.3–0.6 mol% Sc2O3 and 0–2.0 mol% MgO) on the crystal structure and dielectric properties. The analysis results from the transmission electron microscopy revealed that when the content of Sc2O3 doped reached 0.45 mol%, a core-shell structure with a Sc concentration gradient was formed within the BaTiO3 grains, thereby effectively inhibiting the influence of the dielectric constant on temperature change and satisfying the X8R specification. Optimal properties were exhibited when 0.45 mol% Sc2O3 and 1 mol% MgO were doped, which resulted in a dielectric constant of 1744 and dielectric loss of 0.58%. Additionally, the TCC (Temperature Coefficient of Capacitance) was−3.9% at -55°C and −8.5% at 150°C. Favorable insulating properties of 2.8 × 1012 Ω–cm and 1.7 × 1011 Ω–cm were exhibited at the temperatures of 25°C and 150°C, respectively. The non-reducible X9R dielectric ceramic used in this study was a composite dielectric ceramic system (BT-5.26BLT) composed of 94.76 mol% BaTiO3 and 5.26 mol% Ba2LiTa5O15. The effects of various amounts of additives (MnCO3: 0–2 mol%; CaCO3: 0–3 mol%; Li2TiO3: 0–7 mol%; and SiO2: 0-1 mol%) on the crystal structure and dielectric properties of this material system were investigated. X-ray diffraction and scanning electron microscope analyses were conducted to reveal the effects of each additives on the variation of sintered ceramic crystal structures. The results indicated that when components in the sintered ceramic influenced one another and intensified their characteristics, the material’s dielectric temperature properties were stabilized and satisfied the X9R specification. The best composition was determined to be the host material with 5.0% Li2TiO3, 1.5% MnCO3, 2.0% CaCO3 and 1.0% SiO2, which resulted in a dielectric constant of 800 and dielectric loss of 1.4%. Additionally, the TCC was −3.6% at -55°C and −9.2% at 200°C. Favorable insulating properties of 1.2 × 1011 Ω–cm and 7.5 × 109 Ω–cm were exhibited at 25°C and 200°C, respectively. 王錫福 2018 學位論文 ; thesis 180 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 博士 === 國立臺北科技大學 === 材料科學與工程研究所 === 107 === This study investigated non-reducible temperature-stable dielectric ceramics that were non-reducible when sintered and had stable dielectric properties at high temperatures (≥150°C). On the basis of the specifications established by the EIA (Electronic Industries Alliance, U.S.A.) for high dielectric constant capacitors (class II), the materials examined in this study were (1) an X8R dielectric ceramic (−55°C–150°C, ΔC25°C ≤ 15%) and (2) an X9R dielectric ceramic (−55°C–200°C, ΔC25°C ≤ 15%). These two dielectric ceramics that could be applied to different temperature ranges were investigated from different perspectives of material design. Their applicability for use on multilayer ceramic capacitors were tested. To examine the non-reducible X8R dielectric ceramic, BaTiO3+0.05 mol% MnCO3+1.37 mol% BaSiO3 was used as a host material to investigate the effects of varying amounts of additives (0.3–0.6 mol% Sc2O3 and 0–2.0 mol% MgO) on the crystal structure and dielectric properties. The analysis results from the transmission electron microscopy revealed that when the content of Sc2O3 doped reached 0.45 mol%, a core-shell structure with a Sc concentration gradient was formed within the BaTiO3 grains, thereby effectively inhibiting the influence of the dielectric constant on temperature change and satisfying the X8R specification. Optimal properties were exhibited when 0.45 mol% Sc2O3 and 1 mol% MgO were doped, which resulted in a dielectric constant of 1744 and dielectric loss of 0.58%. Additionally, the TCC (Temperature Coefficient of Capacitance) was−3.9% at -55°C and −8.5% at 150°C. Favorable insulating properties of 2.8 × 1012 Ω–cm and 1.7 × 1011 Ω–cm were exhibited at the temperatures of 25°C and 150°C, respectively. The non-reducible X9R dielectric ceramic used in this study was a composite dielectric ceramic system (BT-5.26BLT) composed of 94.76 mol% BaTiO3 and 5.26 mol% Ba2LiTa5O15. The effects of various amounts of additives (MnCO3: 0–2 mol%; CaCO3: 0–3 mol%; Li2TiO3: 0–7 mol%; and SiO2: 0-1 mol%) on the crystal structure and dielectric properties of this material system were investigated. X-ray diffraction and scanning electron microscope analyses were conducted to reveal the effects of each additives on the variation of sintered ceramic crystal structures. The results indicated that when components in the sintered ceramic influenced one another and intensified their characteristics, the material’s dielectric temperature properties were stabilized and satisfied the X9R specification. The best composition was determined to be the host material with 5.0% Li2TiO3, 1.5% MnCO3, 2.0% CaCO3 and 1.0% SiO2, which resulted in a dielectric constant of 800 and dielectric loss of 1.4%. Additionally, the TCC was −3.6% at -55°C and −9.2% at 200°C. Favorable insulating properties of 1.2 × 1011 Ω–cm and 7.5 × 109 Ω–cm were exhibited at 25°C and 200°C, respectively.
author2 王錫福
author_facet 王錫福
Jian-Hua Li
李建樺
author Jian-Hua Li
李建樺
spellingShingle Jian-Hua Li
李建樺
The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
author_sort Jian-Hua Li
title The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
title_short The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
title_full The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
title_fullStr The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
title_full_unstemmed The Study of Non-Reducible High Temperature Stable Dielectric Ceramics
title_sort study of non-reducible high temperature stable dielectric ceramics
publishDate 2018
url http://ndltd.ncl.edu.tw/handle/hgzq5k
work_keys_str_mv AT jianhuali thestudyofnonreduciblehightemperaturestabledielectricceramics
AT lǐjiànhuà thestudyofnonreduciblehightemperaturestabledielectricceramics
AT jianhuali kàngháiyuángāowēnwěndìngjièdiàntáocícáiliàoyánjiū
AT lǐjiànhuà kàngháiyuángāowēnwěndìngjièdiàntáocícáiliàoyánjiū
AT jianhuali studyofnonreduciblehightemperaturestabledielectricceramics
AT lǐjiànhuà studyofnonreduciblehightemperaturestabledielectricceramics
_version_ 1719177789794418688