Equipment for measuring cosmic-ray effects on DRAM
Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset...
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| Format: | Others |
| Language: | English |
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Linköpings universitet, Institutionen för systemteknik
2007
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-9764 |