Framtagning av testutrustning för transistorer vid induktiv last.
When a transistor is used as a switch in a conversion of electrical energy, the switching losses are decisive in the choice of the transistor. In order to compare these losses, a test equipment has been developed, which can be used to perform measurements on different IGBT-transistors when switching...
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Format: | Others |
Language: | Swedish |
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Linnéuniversitetet, Institutionen för fysik och elektroteknik (IFE)
2015
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Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-50654 |