Bailey, T. C. (2008). Imprint template advances and surface modification, and defect analysis for step and flash imprint lithography.
Chicago Style (17th ed.) CitationBailey, Todd Christopher. Imprint Template Advances and Surface Modification, and Defect Analysis for Step and Flash Imprint Lithography. 2008.
MLA (8th ed.) CitationBailey, Todd Christopher. Imprint Template Advances and Surface Modification, and Defect Analysis for Step and Flash Imprint Lithography. 2008.
Warning: These citations may not always be 100% accurate.