Kang, C. Y. (2008). A study of charge trapping effect on high-k device characteristics and reliability; and its implication on circuit operation.
Chicago Style (17th ed.) CitationKang, Chang Yong. A Study of Charge Trapping Effect on High-k Device Characteristics and Reliability; and Its Implication on Circuit Operation. 2008.
MLA (8th ed.) CitationKang, Chang Yong. A Study of Charge Trapping Effect on High-k Device Characteristics and Reliability; and Its Implication on Circuit Operation. 2008.
Warning: These citations may not always be 100% accurate.