APA (7th ed.) Citation

Krishnan, S. A. (2008). Characterization and reliability of HFO₂ and hfsion gate dielectrics with tin metal gate.

Chicago Style (17th ed.) Citation

Krishnan, Siddarth A. Characterization and Reliability of HFO₂ and Hfsion Gate Dielectrics with Tin Metal Gate. 2008.

MLA (8th ed.) Citation

Krishnan, Siddarth A. Characterization and Reliability of HFO₂ and Hfsion Gate Dielectrics with Tin Metal Gate. 2008.

Warning: These citations may not always be 100% accurate.