APA (7th ed.) Citation

Lu, X. (2008). Impact of interconnect scaling on electromigration and stress migration reliability.

Chicago Style (17th ed.) Citation

Lu, Xia. Impact of Interconnect Scaling on Electromigration and Stress Migration Reliability. 2008.

MLA (8th ed.) Citation

Lu, Xia. Impact of Interconnect Scaling on Electromigration and Stress Migration Reliability. 2008.

Warning: These citations may not always be 100% accurate.