Design for manufacturing with advanced lithography
Shrinking the feature size of very large scale integrated circuits (VLSI) with advanced lithography has been a holy grail for the semiconductor industry. However, the gap between manufacturing capability and the expectation of design performance becomes critically challenged in sub-16nm technology n...
Main Author: | Yu, Bei |
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Format: | Others |
Language: | en |
Published: |
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/2152/26936 |
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