Interfacial properties of thin film hetero-structure: copper-oxides of hafnium-silicon

Interfacial properties of thin film hetero-structure: copper-oxides of hafnium-silicon

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Bibliographic Details
Main Author: Park, Hyun Jung
Format: Others
Language:English
Published: 2008
Subjects:
Thin films > Electric properties
Hafnium oxide
Silicon oxide films
Online Access:http://hdl.handle.net/2152/836

Internet

http://hdl.handle.net/2152/836

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