Interfacial properties of thin film hetero-structure: copper-oxides of hafnium-silicon

Interfacial properties of thin film hetero-structure: copper-oxides of hafnium-silicon

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Bibliographic Details
Main Author:	Park, Hyun Jung
Format:	Others
Language:	English
Published:	2008
Subjects:	Thin films > Electric properties Hafnium oxide Silicon oxide films
Online Access:	http://hdl.handle.net/2152/836

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