Online Techniques for Enhancing the Diagnosis of Digital Circuits
The test process for semiconductor devices involves generation and application of test patterns, failure logging and diagnosis. Traditionally, most of these activities cater for all possible faults without making any assumptions about the actual defects present in the circuit. As the size of the cir...
Main Author: | Tanwir, Sarmad |
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Other Authors: | Electrical and Computer Engineering |
Format: | Others |
Published: |
Virginia Tech
2018
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Subjects: | |
Online Access: | http://hdl.handle.net/10919/82736 |
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