Online Techniques for Enhancing the Diagnosis of Digital Circuits

The test process for semiconductor devices involves generation and application of test patterns, failure logging and diagnosis. Traditionally, most of these activities cater for all possible faults without making any assumptions about the actual defects present in the circuit. As the size of the cir...

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Bibliographic Details
Main Author: Tanwir, Sarmad
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2018
Subjects:
Online Access:http://hdl.handle.net/10919/82736

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