Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials
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1992
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ndltd-bl.uk-oai-ethos.bl.uk-3168642015-03-19T10:35:38ZScanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materialsLaczik, Z.1992530.41Semiconductor technologyUniversity of Oxfordhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316864Electronic Thesis or Dissertation |
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topic |
530.41 Semiconductor technology |
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530.41 Semiconductor technology Laczik, Z. Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
author |
Laczik, Z. |
author_facet |
Laczik, Z. |
author_sort |
Laczik, Z. |
title |
Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
title_short |
Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
title_full |
Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
title_fullStr |
Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
title_full_unstemmed |
Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials |
title_sort |
scanning infra-red microscope studies of inhomogeneities in si and gaas ingot materials |
publisher |
University of Oxford |
publishDate |
1992 |
url |
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316864 |
work_keys_str_mv |
AT laczikz scanninginfraredmicroscopestudiesofinhomogeneitiesinsiandgaasingotmaterials |
_version_ |
1716775621399412736 |