Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Bibliographic Details
Main Author:	Laczik, Z.
Published:	University of Oxford 1992
Subjects:	530.41 Semiconductor technology
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316864

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