An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits

Bibliographic Details
Main Author:	Richardson, A. M. D.
Published:	Lancaster University 1991
Subjects:	621.3192 Integrated curcuit testing
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.317411

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spelling	ndltd-bl.uk-oai-ethos.bl.uk-3174112015-03-19T10:00:43ZAn assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuitsRichardson, A. M. D.1991621.3192Integrated curcuit testingLancaster Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.317411Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3192 Integrated curcuit testing
spellingShingle	621.3192 Integrated curcuit testing Richardson, A. M. D. An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
author	Richardson, A. M. D.
author_facet	Richardson, A. M. D.
author_sort	Richardson, A. M. D.
title	An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
title_short	An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
title_full	An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
title_fullStr	An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
title_full_unstemmed	An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits
title_sort	assessment of supply current measurement (iddq) as a reliability indicator for cmos integrated circuits
publisher	Lancaster University
publishDate	1991
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.317411
work_keys_str_mv	AT richardsonamd anassessmentofsupplycurrentmeasurementiddqasareliabilityindicatorforcmosintegratedcircuits AT richardsonamd assessmentofsupplycurrentmeasurementiddqasareliabilityindicatorforcmosintegratedcircuits
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An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits

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