An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits

An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits

Bibliographic Details
Main Author:	Richardson, A. M. D.
Published:	Lancaster University 1991
Subjects:	621.3192 Integrated curcuit testing
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.317411

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